用于DDR5 LPDDR5及GDDR7特性和测试的桌面型ATE测试解决方案

　　用于 GDDR7 特性和测试的 ATE 工作台

　　Introspect technology M5512 GDDR7 内存测试系统平台是一款开创性的解决方 案，可基于 JEDEC GDDR7 的集成电路进行特性化和功能测试。提供高速、双 向 PAM3 讯号、低速 NRZ 信号和完整的协议训练能力，是帮助业界让 DRAM产品 Time to Market 的The best tool.

　　Key Features :

　　Complete memory testing: Connect to all channels in a single GDDR granule to provide testing coverage for all channels.

　　? Programmable power supply: precise programming of power supply and power-off processes for DRAM

　　Excellent signal integrity: The world-class top pin component can operate at a speed of 40 Gbps in PAM3 mode.

　　Communication characteristics: PS level resolution timing and mV resolution shmoo function.

　　Key Beneffts :

　　? Fastest time to market: Deeply execute memory read&write operations and test electrical characteristics and timing specifications

　　The most powerful PAM3 signal transmission: utilizing years of SerDes technology expertise to fully protect the signal specifications of GDDR7 and PAM3.

　　Automation: The software control environment is very suitable for task orchestration, validation, and automated integration control between devices and systems.

　　Access to every pin and every memory cell

　　The M5512 includes an integrated test board for easy DUT attachment.