二硒化钨晶体百分之99.995 WSe2(Tungsten Diselenide)-P型

　　二硒化钨晶体 WSe2(Tungsten Diselenide)-P型

　　晶体尺寸：~10毫米

　　电学性能：半导体，P型

　　晶体结构：六边形

　　晶胞参数：a = b = 0.328 nm, c = 1.298 nm, α = β = 90°, γ = 120°

　　晶体类型：合成

　　晶体纯度：＞99.995%

　　X-ray diffraction on a WSe2 single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 5 XRD peaks correspond, from left to right, to (00l) with l = 2, 4, 6, 8, 10

　　Powder X-ray diffraction (XRD) of a single crystal WSe2. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.

　　Stoichiometric analysis of a single crystal WSe2 by Energy-dispersive X-ray spectroscopy (EDX).

　　Raman spectrum of a single crystal WSe2. Measurement was performed with a 785 nm Raman system at room temperature.